Local supply voltage adjustment for low power parametric yield increase

Matthias Eireiner; Stephan Henzler; Georg Georgakos; Joerg Berthold; Doris Schmitt-Landsiedel

doi:10.1109/ESSCIR.2006.307540

Local supply voltage adjustment for low power parametric yield increase

Matthias Eireiner
, Stephan Henzler
, Georg Georgakos
, Joerg Berthold
, Doris Schmitt-Landsiedel

Medicine and Health

Technical University of Munich
Infineon Technologies AG

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Abstract

A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS.

Original language	English
Title of host publication	ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference
Pages	98-101
Number of pages	4
DOIs	https://doi.org/10.1109/ESSCIR.2006.307540
State	Published - 2006
Event	ESSCIRC 2006 - 32nd European Solid-State Circuits Conference - Montreux, Switzerland Duration: 19 Sep 2006 → 21 Sep 2006

Publication series

Name	ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference

Conference

Conference	ESSCIRC 2006 - 32nd European Solid-State Circuits Conference
Country/Territory	Switzerland
City	Montreux
Period	19/09/06 → 21/09/06

Keywords

Dynamic voltage scaling
Error prediction
Parameter variations and yield

Access to Document

10.1109/ESSCIR.2006.307540

Cite this

Eireiner, M., Henzler, S., Georgakos, G., Berthold, J., & Schmitt-Landsiedel, D. (2006). Local supply voltage adjustment for low power parametric yield increase. In ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference (pp. 98-101). Article 4099713 (ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference). https://doi.org/10.1109/ESSCIR.2006.307540

@inproceedings{bde5b2d077ce4a9f89202b5007981285,

title = "Local supply voltage adjustment for low power parametric yield increase",

abstract = "A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS.",

keywords = "Dynamic voltage scaling, Error prediction, Parameter variations and yield",

author = "Matthias Eireiner and Stephan Henzler and Georg Georgakos and Joerg Berthold and Doris Schmitt-Landsiedel",

year = "2006",

doi = "10.1109/ESSCIR.2006.307540",

language = "English",

isbn = "1424403022",

series = "ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference",

pages = "98--101",

booktitle = "ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference",

note = "ESSCIRC 2006 - 32nd European Solid-State Circuits Conference ; Conference date: 19-09-2006 Through 21-09-2006",

}

Eireiner, M, Henzler, S, Georgakos, G, Berthold, J & Schmitt-Landsiedel, D 2006, Local supply voltage adjustment for low power parametric yield increase. in ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference., 4099713, ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference, pp. 98-101, ESSCIRC 2006 - 32nd European Solid-State Circuits Conference, Montreux, Switzerland, 19/09/06. https://doi.org/10.1109/ESSCIR.2006.307540

Local supply voltage adjustment for low power parametric yield increase. / Eireiner, Matthias; Henzler, Stephan; Georgakos, Georg et al.
ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference. 2006. p. 98-101 4099713 (ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Local supply voltage adjustment for low power parametric yield increase

AU - Eireiner, Matthias

AU - Henzler, Stephan

AU - Georgakos, Georg

AU - Berthold, Joerg

AU - Schmitt-Landsiedel, Doris

PY - 2006

Y1 - 2006

N2 - A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS.

AB - A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS.

KW - Dynamic voltage scaling

KW - Error prediction

KW - Parameter variations and yield

UR - https://www.scopus.com/pages/publications/34347261810

U2 - 10.1109/ESSCIR.2006.307540

DO - 10.1109/ESSCIR.2006.307540

M3 - Conference contribution

AN - SCOPUS:34347261810

SN - 1424403022

SN - 9781424403028

T3 - ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference

SP - 98

EP - 101

BT - ESSCIRC 2006 - Proceedings of the 32nd European Solid-State Circuits Conference

T2 - ESSCIRC 2006 - 32nd European Solid-State Circuits Conference

Y2 - 19 September 2006 through 21 September 2006

ER -

Local supply voltage adjustment for low power parametric yield increase

Abstract

Publication series

Conference

Keywords

Access to Document

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