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Local structure of Ge/Si nanostructures: Uniqueness of XAFS spectroscopy
A. V. Kolobov, H. Oyanagi, A. Frenkel, I. Robinson, J. Cross, S. Wei, K. Brunner, G. Abstreiter, Y. Maeda, A. Shklyaev, M. Ichikawa, S. Yamasaki, K. Tanaka
- Joint Research Center for Atom Technology
- The Russian Academy of Sciences
- National Institute of Advanced Industrial Science and Technology
- Yeshiva University
- University of Illinois Urbana-Champaign
- Argonne National Laboratory
- University of Science and Technology of China
- Walter Schottky Institut
- Osaka Prefecture University
- Angstrom Technology Partnership
Research output: Contribution to journal › Article › peer-review
9
Scopus
citations