Local defects in thin polymer films: A scanning sub-microbeam grazing incidence small angle scattering investigation

P. Müller-Buschbaum; S. V. Roth; M. Burghammer; E. Bauer; S. Pfister; C. David; C. Riekel

doi:10.1016/j.physb.2004.11.045

Local defects in thin polymer films: A scanning sub-microbeam grazing incidence small angle scattering investigation

P. Müller-Buschbaum
, S. V. Roth
, M. Burghammer
, E. Bauer
, S. Pfister
, C. David
, C. Riekel

Chair of Functional Materials

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of 0.9μm the local micrometer sized defect structure is resolved.

Original language	English
Pages (from-to)	148-151
Number of pages	4
Journal	Physica B: Condensed Matter
Volume	357
Issue number	1-2 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.physb.2004.11.045
State	Published - 28 Feb 2005

Keywords

GISAXS
Polymer surfaces
Thin film defects

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10.1016/j.physb.2004.11.045

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title = "Local defects in thin polymer films: A scanning sub-microbeam grazing incidence small angle scattering investigation",

abstract = "Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of 0.9μm the local micrometer sized defect structure is resolved.",

keywords = "GISAXS, Polymer surfaces, Thin film defects",

author = "P. M{\"u}ller-Buschbaum and Roth, \{S. V.\} and M. Burghammer and E. Bauer and S. Pfister and C. David and C. Riekel",

note = "Funding Information: This work was financially supported by the DFG Schwerpunktprogramm SPP 1164 “Nano- and Microfluidics” (Mu1487/2).",

year = "2005",

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doi = "10.1016/j.physb.2004.11.045",

language = "English",

volume = "357",

pages = "148--151",

journal = "Physica B: Condensed Matter",

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publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Local defects in thin polymer films

T2 - A scanning sub-microbeam grazing incidence small angle scattering investigation

AU - Müller-Buschbaum, P.

AU - Roth, S. V.

AU - Burghammer, M.

AU - Bauer, E.

AU - Pfister, S.

AU - David, C.

AU - Riekel, C.

N1 - Funding Information: This work was financially supported by the DFG Schwerpunktprogramm SPP 1164 “Nano- and Microfluidics” (Mu1487/2).

PY - 2005/2/28

Y1 - 2005/2/28

N2 - Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of 0.9μm the local micrometer sized defect structure is resolved.

AB - Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of 0.9μm the local micrometer sized defect structure is resolved.

KW - GISAXS

KW - Polymer surfaces

KW - Thin film defects

UR - https://www.scopus.com/pages/publications/13444254199

U2 - 10.1016/j.physb.2004.11.045

DO - 10.1016/j.physb.2004.11.045

M3 - Article

AN - SCOPUS:13444254199

SN - 0921-4526

VL - 357

SP - 148

EP - 151

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-2 SPEC. ISS.

ER -

Local defects in thin polymer films: A scanning sub-microbeam grazing incidence small angle scattering investigation

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Keywords

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