Learning based Memory Interference Prediction for Co-running Applications on Multi-Cores

Ahsan Saeed, Daniel Mueller-Gritschneder, Falk Rehm, Arne Hamann, Dirk Ziegenbein, Ulf Schlichtmann, Andreas Gerstlauer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Early run-time prediction of co-running independent applications prior to application integration becomes challenging in multi-core processors. One of the most notable causes is the interference at the main memory subsystem, which results in significant degradation in application performance and response time in comparison to standalone execution. Currently available techniques for run-time prediction like traditional cycle-accurate simulations are slow, and analytical models are not accurate and time-consuming to build. By contrast, existing machine-learning-based approaches for run-time prediction simply do not account for interference. In this paper, we use a machine learning-based approach to train a model to correlate performance data (instructions and hardware performance counters) for a set of benchmark applications between the standalone and interference scenarios. After that, the trained model is used to predict the run-time of co-running applications in interference scenarios. In general, there is no straightforward one-to-one correspondence between samples obtained from the standalone and interference scenarios due to the different run-times, i.e. execution speeds. To address this, we developed a simple yet effective sample alignment algorithm, which is a key component in transforming interference prediction into a machine learning problem. In addition, we systematically identify the subset of features that have the highest positive impact on the model performance. Our approach is demonstrated to be effective and shows an average run-time prediction error, which is as low as 0.3% and 0.1% for two co-running applications.

Original languageEnglish
Title of host publication2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD, MLCAD 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665431668
DOIs
StatePublished - 30 Aug 2021
Event3rd ACM/IEEE Workshop on Machine Learning for CAD, MLCAD 2021 - Raleigh, United States
Duration: 30 Aug 20213 Sep 2021

Publication series

Name2021 ACM/IEEE 3rd Workshop on Machine Learning for CAD, MLCAD 2021

Conference

Conference3rd ACM/IEEE Workshop on Machine Learning for CAD, MLCAD 2021
Country/TerritoryUnited States
CityRaleigh
Period30/08/213/09/21

Keywords

  • co-running
  • interference
  • machine learning
  • memory interference
  • microprocessor
  • prediction
  • run-time
  • sample alignment

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