Lateral structuring of silicon thin films by interference crystallization

M. Heintze, P. V. Santos, C. E. Nebel, M. Stutzmann

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Abstract

Laterally structured microcrystalline silicon in the submicron range has been produced from amorphous silicon thin films by transient holography using a high-energy pulse laser. The energy density along the lines of the transient optical grid is sufficient to induce crystallization at the intensity maxima. Large area laterally structured microcrystalline silicon has been produced by selectively etching the amorphous phase with simultaneous growth of μc-Si:H in a hydrogen-silane plasma.

Original languageEnglish
Pages (from-to)3148-3150
Number of pages3
JournalApplied Physics Letters
Volume64
Issue number23
DOIs
StatePublished - 1994

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