TY - GEN
T1 - Late Breaking Results
T2 - 61st ACM/IEEE Design Automation Conference, DAC 2024
AU - Li, Mengchu
AU - Gu, Hanchen
AU - Zhang, Yushen
AU - Liang, Siyuan
AU - Gasvoda, Hudson
AU - Altay, Rana
AU - Araci, Ismail Emre
AU - Tseng, Tsun Ming
AU - Ho, Tsung Yi
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2024 Copyright is held by the owner/author(s). Publication rights licensed to ACM.
PY - 2024/11/7
Y1 - 2024/11/7
N2 - Control channels on microfluidic large-scale integration (mLSI) chips are prone to blockage and leakage defects. In this work, we propose a built-in self-test (BIST) method that drastically improves the test efficiency. Given n to-be-tested control channels, we reduced the number of test patterns for blockage and leakage tests from ⌈n/2 ⌉ to 1, and from ⌈log2(n + 1)⌉ to ⌈log2 (χ (G) + 1)⌉, respectively, where χ(G) denotes the vertex chromatic number of a graph G consisting of n vertices. We fabricated our design and demonstrated the feasibility and efficiency of our method.
AB - Control channels on microfluidic large-scale integration (mLSI) chips are prone to blockage and leakage defects. In this work, we propose a built-in self-test (BIST) method that drastically improves the test efficiency. Given n to-be-tested control channels, we reduced the number of test patterns for blockage and leakage tests from ⌈n/2 ⌉ to 1, and from ⌈log2(n + 1)⌉ to ⌈log2 (χ (G) + 1)⌉, respectively, where χ(G) denotes the vertex chromatic number of a graph G consisting of n vertices. We fabricated our design and demonstrated the feasibility and efficiency of our method.
UR - http://www.scopus.com/inward/record.url?scp=85211145554&partnerID=8YFLogxK
U2 - 10.1145/3649329.3663489
DO - 10.1145/3649329.3663489
M3 - Conference contribution
AN - SCOPUS:85211145554
T3 - Proceedings - Design Automation Conference
BT - Proceedings of the 61st ACM/IEEE Design Automation Conference, DAC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 23 June 2024 through 27 June 2024
ER -