Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

S. H. Chew; A. Gliserin; J. Schmidt; H. Bian; S. Nobis; F. Schertz; M. Kübel; Y. Y. Yang; B. Loitsch; T. Stettner; J. J. Finley; C. Späth; H. Ouacha; A. M. Azzeer; U. Kleineberg

doi:10.1007/s00340-016-6374-3

Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

S. H. Chew, A. Gliserin, J. Schmidt, H. Bian, S. Nobis, F. Schertz, M. Kübel, Y. Y. Yang, B. Loitsch, T. Stettner, J. J. Finley, C. Späth, H. Ouacha, A. M. Azzeer, U. Kleineberg

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Abstract

A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond control of electrons in tailored plasmonic nanostructures spatially and energetically via a carrier-envelope phase tagging technique. First carrier-envelope phase-resolved measurements of gold nanoparticles on gold plane and surface roughness from a gold film show an apparent carrier-envelope phase modulation with a period of π. This modulation is found to originate from an intensity dependence of the photoelectron spectra and the carrier-envelope phase measurement rather than from an intrinsic carrier-envelope phase dependence, which is confirmed by simulations. This useful finding suggests that intensity tagging should be considered for phase tagging experiments on plasmonic nanostructures with low carrier-envelope phase sensitivity in order to correct for the intensity-related carrier-envelope phase artifact.

Original language	English
Article number	102
Journal	Applied Physics B: Lasers and Optics
Volume	122
Issue number	4
DOIs	https://doi.org/10.1007/s00340-016-6374-3
State	Published - 1 Apr 2016

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Chew, S. H., Gliserin, A., Schmidt, J., Bian, H., Nobis, S., Schertz, F., Kübel, M., Yang, Y. Y., Loitsch, B., Stettner, T., Finley, J. J., Späth, C., Ouacha, H., Azzeer, A. M., & Kleineberg, U. (2016). Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy. Applied Physics B: Lasers and Optics, 122(4), Article 102. https://doi.org/10.1007/s00340-016-6374-3

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title = "Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy",

abstract = "A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond control of electrons in tailored plasmonic nanostructures spatially and energetically via a carrier-envelope phase tagging technique. First carrier-envelope phase-resolved measurements of gold nanoparticles on gold plane and surface roughness from a gold film show an apparent carrier-envelope phase modulation with a period of π. This modulation is found to originate from an intensity dependence of the photoelectron spectra and the carrier-envelope phase measurement rather than from an intrinsic carrier-envelope phase dependence, which is confirmed by simulations. This useful finding suggests that intensity tagging should be considered for phase tagging experiments on plasmonic nanostructures with low carrier-envelope phase sensitivity in order to correct for the intensity-related carrier-envelope phase artifact.",

author = "Chew, {S. H.} and A. Gliserin and J. Schmidt and H. Bian and S. Nobis and F. Schertz and M. K{\"u}bel and Yang, {Y. Y.} and B. Loitsch and T. Stettner and Finley, {J. J.} and C. Sp{\"a}th and H. Ouacha and Azzeer, {A. M.} and U. Kleineberg",

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doi = "10.1007/s00340-016-6374-3",

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Chew, SH, Gliserin, A, Schmidt, J, Bian, H, Nobis, S, Schertz, F, Kübel, M, Yang, YY, Loitsch, B, Stettner, T, Finley, JJ, Späth, C, Ouacha, H, Azzeer, AM & Kleineberg, U 2016, 'Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy', Applied Physics B: Lasers and Optics, vol. 122, no. 4, 102. https://doi.org/10.1007/s00340-016-6374-3

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T1 - Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

AU - Chew, S. H.

AU - Gliserin, A.

AU - Schmidt, J.

AU - Bian, H.

AU - Nobis, S.

AU - Schertz, F.

AU - Kübel, M.

AU - Yang, Y. Y.

AU - Loitsch, B.

AU - Stettner, T.

AU - Finley, J. J.

AU - Späth, C.

AU - Ouacha, H.

AU - Azzeer, A. M.

AU - Kleineberg, U.

PY - 2016/4/1

Y1 - 2016/4/1

N2 - A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond control of electrons in tailored plasmonic nanostructures spatially and energetically via a carrier-envelope phase tagging technique. First carrier-envelope phase-resolved measurements of gold nanoparticles on gold plane and surface roughness from a gold film show an apparent carrier-envelope phase modulation with a period of π. This modulation is found to originate from an intensity dependence of the photoelectron spectra and the carrier-envelope phase measurement rather than from an intrinsic carrier-envelope phase dependence, which is confirmed by simulations. This useful finding suggests that intensity tagging should be considered for phase tagging experiments on plasmonic nanostructures with low carrier-envelope phase sensitivity in order to correct for the intensity-related carrier-envelope phase artifact.

AB - A time of flight-photoemission electron microscope is combined with a single-shot stereographic above-threshold ionization phase meter for studying attosecond control of electrons in tailored plasmonic nanostructures spatially and energetically via a carrier-envelope phase tagging technique. First carrier-envelope phase-resolved measurements of gold nanoparticles on gold plane and surface roughness from a gold film show an apparent carrier-envelope phase modulation with a period of π. This modulation is found to originate from an intensity dependence of the photoelectron spectra and the carrier-envelope phase measurement rather than from an intrinsic carrier-envelope phase dependence, which is confirmed by simulations. This useful finding suggests that intensity tagging should be considered for phase tagging experiments on plasmonic nanostructures with low carrier-envelope phase sensitivity in order to correct for the intensity-related carrier-envelope phase artifact.

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JO - Applied Physics B: Lasers and Optics

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ER -

Laser intensity effects in carrier-envelope phase-tagged time of flight-photoemission electron microscopy

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