Laser characterization of semiconductors

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Abstract

Various experimental methods for the structural, optical, and electronic characterization of semiconductors based on lasers are briefly reviewed. Special attention is given to techniques which can be used at room temperature and can easily be implemented for materials, devices, and processes used in photovoltaics.

Original languageEnglish
Pages (from-to)141-152
Number of pages12
JournalMaterials Science Forum
Volume173-174
StatePublished - 1995
EventProceedings of the 1st International Symposium on Semiconductor Processing and Characterization with Lasers - Stuttgart, Ger
Duration: 18 Apr 199420 Apr 1994

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