Abstract
We performed a systematic analysis of the tunneling magnetoresistance (TMR) effect in single grain-boundary junctions formed in epitaxial La2/3Ca1/3MnO3 films deposited on SrTiO3 bicrystals. For magnetic fields H applied parallel to the grain-boundary barrier, an ideal two-level resistance switching behavior with sharp transitions is observed with a TMR effect of up to 300% at 4.2 K and still above 100% at 77 K. Varying the angle between H and the grain boundary results in differently shaped resistance vs H curves. The observed behavior is explained within a model of magnetic domain pinning at the grain-boundary interface.
| Original language | English |
|---|---|
| Pages (from-to) | R9248-R9251 |
| Journal | Physical Review B-Condensed Matter |
| Volume | 62 |
| Issue number | 14 |
| DOIs | |
| State | Published - 1 Oct 2000 |
| Externally published | Yes |
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