Large Tolerance of Lasing Properties to Impurity Defects in GaAs(Sb)-AlGaAs Core-Shell Nanowire Lasers

T. Schreitmüller, H. W. Jeong, H. Esmaielpour, C. E. Mead, M. Ramsteiner, P. Schmiedeke, A. Thurn, A. Ajay, S. Matich, M. Döblinger, L. J. Lauhon, J. J. Finley, G. Koblmüller

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Performance limiting factors for GaAs(Sb)-AlGaAs nanowire (NW) lasers are unveiled by exploring the impact of impurity-induced point defects. Lasing properties show large tolerance to these defects which, however, limit radiative efficiency and lasing threshold beyond critical densities.

Original languageEnglish
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171395
StatePublished - 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 7 May 202410 May 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period7/05/2410/05/24

Keywords

  • Electro-optical waveguides
  • Impurities
  • Lasers
  • Limiting

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