Large-Scale Land Cover Mapping with Fine-Grained Classes via Class-Aware Semi-Supervised Semantic Segmentation

Runmin Dong, Lichao Mou, Mengxuan Chen, Weijia Li, Xin Yi Tong, Shuai Yuan, Lixian Zhang, Juepeng Zheng, Xiao Xiang Zhu, Haohuan Fu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

Semi-supervised learning has attracted increasing attention in the large-scale land cover mapping task. However, existing methods overlook the potential to alleviate the class imbalance problem by selecting a suitable set of unlabeled data. Besides, in class-imbalanced scenarios, existing pseudo-labeling methods mostly only pick confident samples, failing to exploit the hard samples during training. To tackle these issues, we propose a unified Class-Aware Semi-Supervised Semantic Segmentation framework. The proposed framework consists of three key components. To construct a better semi-supervised learning dataset, we propose a class-aware unlabeled data selection method that is more balanced towards the minority classes. Based on the built dataset with improved class balance, we propose a Class-Balanced Cross Entropy loss, jointly considering the annotation bias and the class bias to re-weight the loss in both sample and class levels to alleviate the class imbalance problem. Moreover, we propose the Class Center Contrast method to jointly utilize the labeled and unlabeled data. Specifically, we decompose the feature embedding space using the ground truth and pseudo-labels, and employ the embedding centers for hard and easy samples of each class per image in the contrast loss to exploit the hard samples during training. Compared with state-of-the-art class-balanced pseudo-labeling methods, the proposed method improves the mean accuracy and mIoU by 4.28% and 1.70%, respectively, on the large-scale Sentinel-2 dataset with 24 land cover classes.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages16737-16747
Number of pages11
ISBN (Electronic)9798350307184
DOIs
StatePublished - 2023
Event2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France
Duration: 2 Oct 20236 Oct 2023

Publication series

NameProceedings of the IEEE International Conference on Computer Vision
ISSN (Print)1550-5499

Conference

Conference2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Country/TerritoryFrance
CityParis
Period2/10/236/10/23

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