TY - JOUR
T1 - Large area deposition of YBCO thick films for applications in resistive fault current limiting devices
AU - Neumüller, H. W.
AU - Schmidt, W.
AU - Kinder, H.
AU - Freyhardt, H. C.
AU - Stritzker, B.
AU - Wördenweber, R.
AU - Kirchhoff, V.
PY - 1997/4
Y1 - 1997/4
N2 - The preparation of the switching element of a resistive superconducting fault current limiter requires the up-scaling of deposition techniques for thin YBa2Cu3O7-a (YBCO) films to large areas and high film thicknesses. For a projected 100 kVA limiter model an area of about 400 cm2 and a film thickness of up to 5 μm will be necessary, depending on the material properties like critical current density jc and normal state resistivity ρn. Within a joint project various deposition methods including pulsed laser deposition (PLD), magnetron sputtering(MS), thermal evaporation (TE) and plasma flash evaporation (PFE) are evaluated as possible candidates for the operation of deposition systems capable of coating 20x20 cm2 substrates. Both single crystalline wafers and polycrystalline ceramic plates are considered as substrates. To achieve high jc on polycrystalline substrate materials an additional zirconia buffer layer consisting of biaxially orientated crystallites has to be prepared by ion beam assisted deposition (IBAD). In small samples with IBAD buffer critical currents above 105 A cm-2 with a maximum of 1x106 A cm-2 have been achieved. The presently available sample sizes depend on the installed systems for YBCO and buffer deposition, respectively and on the commercial availability of the substrate material. The largest samples which have been prepared and characterised have sizes of 1x25 cm2 and 5x5 cm2 for PLD, 10x10 cm2 for TE and IBAD, 2 in, (1 in,=2.54 cm) diameter for MS, and 3x7 cm2 for PFE. The corresponding highest film thicknesses are 4.5 μm for PLD, 1.4 μm for TE, 1.6 μm for IBAD and 0.4 μm for MS.
AB - The preparation of the switching element of a resistive superconducting fault current limiter requires the up-scaling of deposition techniques for thin YBa2Cu3O7-a (YBCO) films to large areas and high film thicknesses. For a projected 100 kVA limiter model an area of about 400 cm2 and a film thickness of up to 5 μm will be necessary, depending on the material properties like critical current density jc and normal state resistivity ρn. Within a joint project various deposition methods including pulsed laser deposition (PLD), magnetron sputtering(MS), thermal evaporation (TE) and plasma flash evaporation (PFE) are evaluated as possible candidates for the operation of deposition systems capable of coating 20x20 cm2 substrates. Both single crystalline wafers and polycrystalline ceramic plates are considered as substrates. To achieve high jc on polycrystalline substrate materials an additional zirconia buffer layer consisting of biaxially orientated crystallites has to be prepared by ion beam assisted deposition (IBAD). In small samples with IBAD buffer critical currents above 105 A cm-2 with a maximum of 1x106 A cm-2 have been achieved. The presently available sample sizes depend on the installed systems for YBCO and buffer deposition, respectively and on the commercial availability of the substrate material. The largest samples which have been prepared and characterised have sizes of 1x25 cm2 and 5x5 cm2 for PLD, 10x10 cm2 for TE and IBAD, 2 in, (1 in,=2.54 cm) diameter for MS, and 3x7 cm2 for PFE. The corresponding highest film thicknesses are 4.5 μm for PLD, 1.4 μm for TE, 1.6 μm for IBAD and 0.4 μm for MS.
KW - Large area deposition
KW - Magnetron sputtering
KW - Pulsed laser deposition
KW - Resistive fault-current-limiter
KW - Superconducting thick films
KW - Superconductivity in power engineering
KW - Thermal co-evaporation
UR - http://www.scopus.com/inward/record.url?scp=0031123144&partnerID=8YFLogxK
U2 - 10.1016/S0925-8388(96)02691-6
DO - 10.1016/S0925-8388(96)02691-6
M3 - Article
AN - SCOPUS:0031123144
SN - 0925-8388
VL - 251
SP - 366
EP - 372
JO - Journal of Alloys and Compounds
JF - Journal of Alloys and Compounds
IS - 1-2
ER -