Skip to main navigation Skip to search Skip to main content

Kr implantation into heavy ion irradiated monolithic U-Mo/Al systems: SIMS and SEM investigations

  • T. Zweifel
  • , N. Valle
  • , C. Grygiel
  • , I. Monnet
  • , L. Beck
  • , W. Petry
  • Technical University of Munich
  • Luxembourg Institute of Science and Technology
  • Université de Caen Normandie
  • Maier-Leibnitz-Laboratorium der Münchner Universitäten (MLL)

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Worldwide, high performance research and material test reactors are aiming to convert their fuel from high enriched uranium towards low enriched ones. High density U-Mo/Al based nuclear fuels are considered as a promising candidate for this conversion. However, during in-pile test irradiations, the formation of an interdiffusion layer (IDL) between the U-Mo and the Al matrix is observed, caused by irradiation enhanced U-Al interdiffusion processes. This IDL accumulates fission gases at the IDL/matrix interfaces. Together, these two effects strongly reduce the performance of this new fuel type. Recently, the out-of-pile technique of heavy ion irradiation (127I) on U-Mo/Al layer systems proved to be an alternative to time-consuming in-pile test irradiations for certain fuel behaviour aspects. Here we present SIMS and SEM investigations of non-conventional 82Kr implantation into previously heavy ion irradiated U-Mo/Al layer systems. It is shown that Kr accumulates inside μm large porosities at the IDL/matrix interfaces. This critical accumulation of μm-sized large gas bubbles is directly related to the presence of the irradiation induced IDL. Without IDL no critical accumulation of fission gas bubbles occurs.

Original languageEnglish
Pages (from-to)251-257
Number of pages7
JournalJournal of Nuclear Materials
Volume470
DOIs
StatePublished - 1 Mar 2016

Keywords

  • MTR
  • SIMS
  • Swift heavy ion irradiation
  • U-Mo

Fingerprint

Dive into the research topics of 'Kr implantation into heavy ion irradiated monolithic U-Mo/Al systems: SIMS and SEM investigations'. Together they form a unique fingerprint.

Cite this