Kapitza transmission through atomically clean silicon (1 1 1) surfaces

K. H. Wiehert; C. Reimann; G. Blahusch; H. Kinder

doi:10.1016/0921-4526(95)00842-X

Kapitza transmission through atomically clean silicon (1 1 1) surfaces

K. H. Wiehert, C. Reimann, G. Blahusch, H. Kinder

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Technical University of Munich

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Abstract

The phonon transmission from atomic clean Si(1 1 1) surfaces into liquid helium was studied by the phonon pulse technique. Reflection experiments and angular resolving transmission experiments were performed to measure the absolute value of the transmission coefficient and its dependence on the phonon emission angle into the solid. A coefficient of the order of 1% was obtained by a chemical preparation method. We found that the observed anomalous transmission is caused by mass defects. Local inhomogeneities caused by the deposition of water molecules on the surface could be visualised by an enhanced transmission.

Original language	English
Pages (from-to)	653-655
Number of pages	3
Journal	Physica B: Condensed Matter
Volume	219-220
Issue number	1-4
DOIs	https://doi.org/10.1016/0921-4526(95)00842-X
State	Published - 1 Apr 1996

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abstract = "The phonon transmission from atomic clean Si(1 1 1) surfaces into liquid helium was studied by the phonon pulse technique. Reflection experiments and angular resolving transmission experiments were performed to measure the absolute value of the transmission coefficient and its dependence on the phonon emission angle into the solid. A coefficient of the order of 1% was obtained by a chemical preparation method. We found that the observed anomalous transmission is caused by mass defects. Local inhomogeneities caused by the deposition of water molecules on the surface could be visualised by an enhanced transmission.",

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AU - Blahusch, G.

AU - Kinder, H.

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N2 - The phonon transmission from atomic clean Si(1 1 1) surfaces into liquid helium was studied by the phonon pulse technique. Reflection experiments and angular resolving transmission experiments were performed to measure the absolute value of the transmission coefficient and its dependence on the phonon emission angle into the solid. A coefficient of the order of 1% was obtained by a chemical preparation method. We found that the observed anomalous transmission is caused by mass defects. Local inhomogeneities caused by the deposition of water molecules on the surface could be visualised by an enhanced transmission.

AB - The phonon transmission from atomic clean Si(1 1 1) surfaces into liquid helium was studied by the phonon pulse technique. Reflection experiments and angular resolving transmission experiments were performed to measure the absolute value of the transmission coefficient and its dependence on the phonon emission angle into the solid. A coefficient of the order of 1% was obtained by a chemical preparation method. We found that the observed anomalous transmission is caused by mass defects. Local inhomogeneities caused by the deposition of water molecules on the surface could be visualised by an enhanced transmission.

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JF - Physica B: Condensed Matter

IS - 1-4

ER -

Kapitza transmission through atomically clean silicon (1 1 1) surfaces

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