Ionization energy and electron affinity of clean and oxidized Al xGa1-xN(0001) surfaces

H. Nienhaus, M. Schneider, S. P. Grabowski, W. Mönch, R. Dimitrov, O. Ambacher, M. Stutzmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

13 Scopus citations

Abstract

Ionization energies and electron affinities of clean AlxGa 1-xN(0001) surfaces were investigated by ultraviolet photoemission spectroscopy over the whole composition range. The samples were cleaned with cycles of N+-ion sputtering and annealing partly within a Ga atom flux. The ionization energy is measured as 6.5 eV and is almost independent of the aluminum content in good agreement with the general chemical trend. The electron affinity decreases linearly with composition from 3.1 eV for GaN to 0.25 eV for AlN. No evidence for negative electron affinity at AlN(0001) surfaces was found. Adsorption of oxygen at room temperature leads to a significant increase of the ionization energy and electron affinity. With AlN(0001) surfaces, an oxygen uptake of 0.6 monolayers is observed after exposures of 108 Langmuirs and the ionization energy increases by approximately 2 eV.

Original languageEnglish
Title of host publicationWide-Bandgap Electronics
PublisherMaterials Research Society
Pages96-101
Number of pages6
ISBN (Print)1558996168, 9781558996168
DOIs
StatePublished - 2001
Event2001 MRS Spring Meeting - San Francisco, CA, United States
Duration: 16 Apr 200120 Apr 2001

Publication series

NameMaterials Research Society Symposium Proceedings
Volume680
ISSN (Print)0272-9172

Conference

Conference2001 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period16/04/0120/04/01

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