Investigation of Scattering Losses in a Buried Tunnel Junction 4m GaSb VCSEL

Andrea Simaz, Pierluigi Debernardi, Mina Beshara, Mikhail A. Belkin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The aim of this work is to investigate the scattering losses induced by the buried tunnel junction (BTJ) in a VCSEL operating at 4m for gas spectroscopy [1]. In this device, losses are even more important than in a standard VCSEL, due to the presence of an active region (AR) of type II which displays lower gain compared to type I. This is due to a reduced carrier wavefunction overlapped integral. Therefore a robust optical design should guarantee minimal losses. In fact, the presence of the BTJ inside the cavity enables scattering losses, which is a very well known problem in long wavelength VCSEL; in [2] the effect of the BTJ size in a VCSEL emitting at 2.3m was investigated by keeping the etching height constant and varying the step aperture and smoothness.

Original languageEnglish
Title of host publication2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665418768
DOIs
StatePublished - Jun 2021
Event2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021 - Munich, Germany
Duration: 21 Jun 202125 Jun 2021

Publication series

Name2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021

Conference

Conference2021 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2021
Country/TerritoryGermany
CityMunich
Period21/06/2125/06/21

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