Investigation of GaAs/AIGaAs quantum well lasers by micro raman spectroscopy

S. Beeck, T. Egeler, G. Abstreiter, H. Brugger, P. W. Epperlein, D. J. Webb, C. Hanke, C. Hoyler, L. Korte

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

GaAs/AlGaAs quantum well lasers are investigated with non destructive micro Raman spectroscopy. Electronic properties and temperature behaviour at the mirror surfaces were studied by probe lasers with high spatial resolution. Electric field induced Raman scattering (EFIRS) is suitable for observing the band bending, caused by surface states. Temperature behaviour of coated and uncoated mirrors and the spatial temperature profile are investigated by measuring the Stokes- and anti-Stokes intensities of the GaAs TO-phonon. Resonant electronic Raman scattering leads to spatial distribution of carrier densities.

Original languageEnglish
Title of host publicationESSDERC 1989 - Proceedings of the 19th European Solid State Device Research Conference
EditorsHeiner Ryssel, Anton Heuberger, Peter Lange
PublisherIEEE Computer Society
Pages508-511
Number of pages4
ISBN (Electronic)0387510001
ISBN (Print)9780387510002
StatePublished - 1989
Event19th European Solid State Device Research Conference, ESSDERC 1989 - Berlin, Germany
Duration: 11 Sep 198914 Sep 1989

Publication series

NameEuropean Solid-State Device Research Conference
ISSN (Print)1930-8876

Conference

Conference19th European Solid State Device Research Conference, ESSDERC 1989
Country/TerritoryGermany
CityBerlin
Period11/09/8914/09/89

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