Intrinsic ionic centers in solid Xe

O. N. Grigorashchenko, O. M. Sokolov, E. V. Savchenko, J. Agreiter, N. Caspary, A. Lammers, V. E. Bondybey

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

Intrinsic ionic centers in solid Xe have been studied using laser-induced fluorescence technique (LIF). Formation of ionic molecular centers has been revealed in the lattice and condition of their stability has been established. To get insight into the electronic structure and the atomic configuration of ionic centers, a set of experiments has been performed employing Ar and Ne matrices doped with Xe at different concentrations. A LIF band at 2.1-2.2 eV has been observed in the solids under excitation within the range of the absorption band of the emitting centers. A correlation between the intensity of the LIF band - nearly identical to the LIF band in pure solid Xe - and the concentration of Xe dimers expected for statistically distributed impurities in matrices has been found. It suggests that the stable ionic centers in the lattice are formed in a configuration similar to the molecular ions Xe2+ and the structure of self-trapped and trapped holes resembles that of the dimer ions. The identification of the transitions observed has been suggested.

Original languageEnglish
Pages (from-to)197-202
Number of pages6
JournalRadiation Effects and Defects in Solids
Volume149
Issue number1 -4 pt 1
DOIs
StatePublished - 1999
EventProceedings of the 1998 8th Europhysical Conference on Defects in Insulating Materials, EURODIM 98 - Keele, UK
Duration: 6 Jun 199811 Jun 1998

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