Abstract
The influence of various deposition parameters on the electrical and optical properties and the structure of amorphous and microcrystalline silicon films was investigated for material prepared by hot-wire (HW) CVD in a new multichamber deposition system, designed for the development of thin film solar cells. Prior to the material studies, careful measurement of the real substrate temperature under the influence of additional HW heating was performed. While good electronic quality and solar cell performance was found for a-Si:H layers, the μc-Si:H material showed very high spin densities, porosity and a characteristic structural inhomogeneity along the growth axis.
Original language | English |
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Pages (from-to) | 305-309 |
Number of pages | 5 |
Journal | Thin Solid Films |
Volume | 395 |
Issue number | 1-2 |
DOIs | |
State | Published - 3 Sep 2001 |
Event | Proceedings of the First International Conference on Cat-CVD - Kanazawa, Japan Duration: 14 Nov 2000 → 17 Nov 2000 |
Keywords
- Hot-wire CVD
- Silicon
- Solar cells
- Structural properties