Interface analysis of the system Si/YBa2Cu3O7-x

C. Ziegler; F. Baudenbacher; H. Karl; H. Kinder; W. Göpel

doi:10.1007/BF00321569

Interface analysis of the system Si/YBa₂Cu₃O_7-x

C. Ziegler, F. Baudenbacher, H. Karl, H. Kinder, W. Göpel

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Abstract

The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa₂Cu₃O_7-x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile analysis show an enrichment of barium at the interface between the superconductor and silicon for samples with T_c<76 K. Comparison with XPS data obtained for thin silicon films on YBCO indicates the formation of barium and yttrium silicates at the interface under these conditions.

Original language	English
Pages (from-to)	308-313
Number of pages	6
Journal	Fresenius' Journal of Analytical Chemistry
Volume	341
Issue number	3-4
DOIs	https://doi.org/10.1007/BF00321569
State	Published - Mar 1991

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title = "Interface analysis of the system Si/YBa2Cu3O7-x",

abstract = "The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa2Cu3O7-x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile analysis show an enrichment of barium at the interface between the superconductor and silicon for samples with Tc<76 K. Comparison with XPS data obtained for thin silicon films on YBCO indicates the formation of barium and yttrium silicates at the interface under these conditions.",

author = "C. Ziegler and F. Baudenbacher and H. Karl and H. Kinder and W. G{\"o}pel",

year = "1991",

month = mar,

doi = "10.1007/BF00321569",

language = "English",

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pages = "308--313",

journal = "Fresenius' Journal of Analytical Chemistry",

issn = "0937-0633",

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T1 - Interface analysis of the system Si/YBa2Cu3O7-x

AU - Ziegler, C.

AU - Baudenbacher, F.

AU - Karl, H.

AU - Kinder, H.

AU - Göpel, W.

PY - 1991/3

Y1 - 1991/3

N2 - The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa2Cu3O7-x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile analysis show an enrichment of barium at the interface between the superconductor and silicon for samples with Tc<76 K. Comparison with XPS data obtained for thin silicon films on YBCO indicates the formation of barium and yttrium silicates at the interface under these conditions.

AB - The influence of different preparation conditions and substrate surface orientations on the superconducting properties of thin YBa2Cu3O7-x (YBCO) films on silicon was studied. Comparative electrical and surface spectroscopic measurements were performed. SAM and SIMS depth profile analysis show an enrichment of barium at the interface between the superconductor and silicon for samples with Tc<76 K. Comparison with XPS data obtained for thin silicon films on YBCO indicates the formation of barium and yttrium silicates at the interface under these conditions.

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U2 - 10.1007/BF00321569

DO - 10.1007/BF00321569

M3 - Article

AN - SCOPUS:3643091201

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JO - Fresenius' Journal of Analytical Chemistry

JF - Fresenius' Journal of Analytical Chemistry

IS - 3-4

ER -

Interface analysis of the system Si/YBa₂Cu₃O_7-x

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