Abstract
An improved model for the calculation of statistical time lags in SF//6 insulated electrode arrangements for positive impulse voltage is presented. On the basis of physical considerations, the production rate of initial electrons is ascribed to the local density of negative SF//6 ions and to field dependent electron detachment. Values of negative ion densities are measured directly, while the detachment coefficient is determined by a fitting procedure to measurements of statistical time lags. The understanding of the relevant physical processes is a step forward toward an optimization of testing procedures and the judgment of their efficacy.
| Original language | English |
|---|---|
| State | Published - 1987 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'INHOMOGENEOUS FIELD BREAKDOWN IN GIS - THE PREDICTION OF BREAKDOWN PROBABILITIES AND VOLTAGES.'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver