Abstract
An improved model for the calculation of statistical time lags in sf6 insulated electrode arrangements for positive impulse voltage is presented. On the basis of physical considerations, the production rate of initial electrons is ascribed to the local density of negative SF6 ions and to field dependent electron detachment Values of negative ion densities are measured directly, while the detachment coefficient is determined by a fitting procedure to measurements of statistical time lags. The understanding of the relevant physical processes is a step forward toward an optimization of testing procedures and the judgement of their efficacy.
Original language | English |
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Pages (from-to) | 931-938 |
Number of pages | 8 |
Journal | IEEE Transactions on Power Delivery |
Volume | 3 |
Issue number | 3 |
DOIs | |
State | Published - Jul 1988 |