Abstract
Millimeter-waves can be used to detect and identify objects e. g. those hidden by clothes on a person's body. For this purpose, several approaches have been developed. When specular reflections are accessed by the imaging system, the resulting millimeter-wave images are mainly determined by their high amplitude response. Additional contributions to the scattered field arise for measurement configurations with slanted illumination. As an example the different contributions of a metallic plate using the Uniform Theory of Diffraction (UTD) are shown for different measurement setups. Taking advantage of the different spatial distribution imaging systems can be tailored by a selection of a proper configuration of the aperture for the imaging of total objects or object inhomogeneities such as edges and corners only.
| Original language | English |
|---|---|
| Pages (from-to) | 152-156 |
| Number of pages | 5 |
| Journal | Frequenz |
| Volume | 63 |
| Issue number | 7-8 |
| DOIs | |
| State | Published - 2009 |
Keywords
- Measurement configuration
- Millimeter-wave imaging
- Object dependent resolution
- Resolution
- Scattering
- Uniform theory of diffraction