Influence of microstructural parameters on macroscopic residual stress analysis of complex materials by neutron diffraction methods

J. Repper, M. Hofmann, C. Krempaszky, W. Petry, E. Werner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Mechanical and thermal treatments during the manufacturing process inevitably cause the accumulation of residual stresses in parts consisting of materials with complex microstructures. Neutron diffraction is particularly well suited to determine residual stress distributions within the bulk of the component. Due to the nature of a diffraction experiment an inextricable mixture of type I and II residual stresses is measured. The accumulation of type II stresses (microstresses) is strongly related to the microstructure. The impact of changes in the microstructure on neutron diffraction experiments has been investigated on Inconel 718 (IN718) samples.

Original languageEnglish
Title of host publicationStress Evaluation in Materials Using Neutrons and Synchrotron Radiation - Selected, peer reviewed papers from the Int. Conf. on Stress Evaluation Using Neutrons and Synchrotron Radiation Proceedings
EditorsA.R. Pyzalla, A. Borbely, H. Peter Degischer
PublisherTrans Tech Publications Ltd
Pages39-44
Number of pages6
ISBN (Electronic)9780878493609
DOIs
StatePublished - 2008
EventInternational Conference on Stress Evaluation Using Neutrons and Synchrotron Radiation - Vienna, Austria
Duration: 24 Sep 200726 Sep 2007

Publication series

NameMaterials Science Forum
Volume571-572
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

ConferenceInternational Conference on Stress Evaluation Using Neutrons and Synchrotron Radiation
Country/TerritoryAustria
CityVienna
Period24/09/0726/09/07

Keywords

  • Microstructure
  • Neutron diffraction
  • Residual stress
  • Superalloys

Fingerprint

Dive into the research topics of 'Influence of microstructural parameters on macroscopic residual stress analysis of complex materials by neutron diffraction methods'. Together they form a unique fingerprint.

Cite this