TY - GEN
T1 - Influence of Field Strength and Temperature on the Space Charge Distribution in Epoxy under DC Stress
AU - Wendel, T.
AU - Kindersberger, J.
AU - Hering, M.
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - The relevant physical mechanisms influencing the space charge accumulation in solid insulating materials for gas insulated systems are studied. Space charge measurements according to the pulsed electro acoustic method (PEA) in epoxy samples are performed under DC stress. The influence of temperature and field strength on the space charge distribution is clarified. The accumulation of homo charges is observed, even at short stress durations. It is explained by the injection of charge carriers from the electrodes into the material. At longer stress durations hetero charges accumulate close to both electrodes. The accumulated charge in the material increases with applied field strength. Higher temperatures accelerate the accumulation of homo and hetero charges.
AB - The relevant physical mechanisms influencing the space charge accumulation in solid insulating materials for gas insulated systems are studied. Space charge measurements according to the pulsed electro acoustic method (PEA) in epoxy samples are performed under DC stress. The influence of temperature and field strength on the space charge distribution is clarified. The accumulation of homo charges is observed, even at short stress durations. It is explained by the injection of charge carriers from the electrodes into the material. At longer stress durations hetero charges accumulate close to both electrodes. The accumulated charge in the material increases with applied field strength. Higher temperatures accelerate the accumulation of homo and hetero charges.
UR - http://www.scopus.com/inward/record.url?scp=85063104901&partnerID=8YFLogxK
U2 - 10.1109/ICHVE.2018.8641892
DO - 10.1109/ICHVE.2018.8641892
M3 - Conference contribution
AN - SCOPUS:85063104901
T3 - ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application
BT - ICHVE 2018 - 2018 IEEE International Conference on High Voltage Engineering and Application
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 IEEE International Conference on High Voltage Engineering and Application, ICHVE 2018
Y2 - 10 September 2018 through 13 September 2018
ER -