Abstract
Various aspects of inelastic light scattering studies of low-dimensional semiconductor structures are discussed. This includes anisotropy of phonon dispersion in GaAs/AlAs superlattices, interface phonons in Si/Ge superlattices and electronic excitations in quantum wires and dots. Many of these studies require Raman scattering with high spatial resolution.
Original language | English |
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Pages (from-to) | 193-200 |
Number of pages | 8 |
Journal | Journal of Raman Spectroscopy |
Volume | 27 |
Issue number | 3-4 |
DOIs | |
State | Published - 1996 |