Skip to main navigation Skip to search Skip to main content

In situ IR-spectroscopy as a tool for monitoring the radical hydrosilylation process on silicon nanocrystal surfaces

  • Julian Kehrle
  • , Simon Kaiser
  • , Tapas K. Purkait
  • , Malte Winnacker
  • , Tobias Helbich
  • , Sergei Vagin
  • , Jonathan G.C. Veinot
  • , Bernhard Rieger
  • Technical University of Munich
  • Johns Hopkins University
  • University of Alberta

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Among a variety of SiNC functionalization methods, radical initiated grafting is very promising due to its straightforward nature and low propensity to form surface oligomers. In the present study, we employed in situ IR spectroscopy in combination with visible light transmittance measurements to investigate the radical induced grafting process on the well-defined SiNCs. Our findings support the proposed model: unfunctionalized hydride-terminated SiNCs form agglomerates in organic solvents, which break up during the grafting process. However, clearing of the dispersion is not a valid indicator for complete surface functionalization. Furthermore, radical-initiated grafting reactions in which azobisisobutyronitrile (AIBN) is the initiator are strongly influenced by external factors including initiator concentration, grafting temperature, as well as substrate steric demand. The monomer concentration was proven to have a low impact on the grafting process. Based on these new insights an underlying mechanism could be discussed, offering an unprecedented view on the functionalization of SiNC surfaces via radical initiated hydrosilylation.

Original languageEnglish
Pages (from-to)8489-8495
Number of pages7
JournalNanoscale
Volume9
Issue number24
DOIs
StatePublished - 28 Jun 2017

Fingerprint

Dive into the research topics of 'In situ IR-spectroscopy as a tool for monitoring the radical hydrosilylation process on silicon nanocrystal surfaces'. Together they form a unique fingerprint.

Cite this