TY - GEN
T1 - In Silico Study of the Surface Plasmon Resonance Use for Detecting Cancer in the Colorectal Mucosa
AU - Melo, Arthur A.
AU - Rodrigues, Eloise P.
AU - Lima, Antonio M.N.
AU - Moreira, Cleumar S.
AU - Cruz, Rossana M.S.
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - This paper presents an in silico study regarding the use of a trapezoidal prism-based surface plasmon resonance sensor to detect cancer in the colorectal mucosa. The parameters of the surface plasmon resonance curves o the multilayered structure operating in the wavelength interrogation mode were studied by exploring the metallic film characteristics. The height of the thin films of gold, silver, and copper was studied to find the best sensitivity. Whereas a p-polarized light beam, with a range of 450 to 820 nm, falls on the multilayered structure at an angle of 68 degrees, the Fresnel equations were chosen to calculate the reflectance curve. From the evaluated results, we realized that the greater results were reached when we used a 40 nm silver film, resulting in 6,454.12 nm/RIU for a sensitivity value.
AB - This paper presents an in silico study regarding the use of a trapezoidal prism-based surface plasmon resonance sensor to detect cancer in the colorectal mucosa. The parameters of the surface plasmon resonance curves o the multilayered structure operating in the wavelength interrogation mode were studied by exploring the metallic film characteristics. The height of the thin films of gold, silver, and copper was studied to find the best sensitivity. Whereas a p-polarized light beam, with a range of 450 to 820 nm, falls on the multilayered structure at an angle of 68 degrees, the Fresnel equations were chosen to calculate the reflectance curve. From the evaluated results, we realized that the greater results were reached when we used a 40 nm silver film, resulting in 6,454.12 nm/RIU for a sensitivity value.
KW - SPR sensor
KW - colorectal cancer
KW - thin metal film
KW - trapezoidal prism
UR - http://www.scopus.com/inward/record.url?scp=85134435517&partnerID=8YFLogxK
U2 - 10.1109/I2MTC48687.2022.9806452
DO - 10.1109/I2MTC48687.2022.9806452
M3 - Conference contribution
AN - SCOPUS:85134435517
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
BT - I2MTC 2022 - IEEE International Instrumentation and Measurement Technology Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022
Y2 - 16 May 2022 through 19 May 2022
ER -
