In-line reference measurement for surface second harmonic generation spectroscopy

Aras Kartouzian, Philipp Heister, Martin Thämer, Sabine Gerlach, Ulrich Heiz

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Surface second harmonic generation (s-SHG) spectroscopy is a powerful tool to investigate layers or adsorbates on surfaces with high sensitivity. For this nonlinear technique, sophisticated reference methods are needed to properly treat the measured raw data. We present an easy-to-implement reference measurement method for s-SHG spectroscopy for surface layers or adsorbates. It directly allows for extracting reference-corrected s-SHG spectra from raw data. SHG from thin slabs of BK7 and MgO in the spectral range from 450 to 900 nm (fundamental beam) is used to obtain the reference spectrum. The method includes the experimental determination of the dispersive properties of the optical setup over the relevant spectral range. The accuracy of the presented procedure is demonstrated by applying the method to the study of a thin molecular film of 1, 1'-Bi-2-naphthol (Binol) supported on a BK7 substrate.

Original languageEnglish
Pages (from-to)541-548
Number of pages8
JournalJournal of the Optical Society of America B: Optical Physics
Volume30
Issue number3
DOIs
StatePublished - Mar 2013
Externally publishedYes

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