TY - GEN
T1 - Improvements of a Laboratory Phase-Contrast Nano-Computed Tomography System
AU - Ilg, Patrick
AU - Schurius, Oliver
AU - Dierolf, Martin
AU - Günther, Benedikt
AU - Pfeiffer, Franz
N1 - Publisher Copyright:
© 2024 SPIE.
PY - 2024
Y1 - 2024
N2 - Nano Computed Tomography (nanoCT) is a powerful tool for non-destructive three-dimensional specimen visualization and investigation at the submicron scale. Here, we present our lensless lab-based nanoCT setup, which combines a nanofocus X-ray source with a photon-counting detector. On the one hand, the X-ray source’s coherence enables propagation-based phase-contrast, which is beneficial for investigating low-absorbing specimens, e.g., in virtual 3D-histology of biopsies and material science. We describe the setup, discuss its optimization, focusing on acquisition speed and field of view increase, and present the latest results.
AB - Nano Computed Tomography (nanoCT) is a powerful tool for non-destructive three-dimensional specimen visualization and investigation at the submicron scale. Here, we present our lensless lab-based nanoCT setup, which combines a nanofocus X-ray source with a photon-counting detector. On the one hand, the X-ray source’s coherence enables propagation-based phase-contrast, which is beneficial for investigating low-absorbing specimens, e.g., in virtual 3D-histology of biopsies and material science. We describe the setup, discuss its optimization, focusing on acquisition speed and field of view increase, and present the latest results.
KW - nano computed tomography
KW - nanofocus source
KW - photon-counting detector
KW - propagation-based phase-contrast
KW - virtual histology
UR - http://www.scopus.com/inward/record.url?scp=85212470231&partnerID=8YFLogxK
U2 - 10.1117/12.3029536
DO - 10.1117/12.3029536
M3 - Conference contribution
AN - SCOPUS:85212470231
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Developments in X-Ray Tomography XV
A2 - Muller, Bert
A2 - Wang, Ge
PB - SPIE
T2 - 15th SPIE Conference on Developments in X-Ray Tomography
Y2 - 19 August 2024 through 22 August 2024
ER -