Abstract
Amorphous (a-) SiCx:H films were deposited in a rf glow discharge of disilylmethane/silane mixtures. At optical gaps larger than 2 eV these films are found to have a higher photoconductivity than films prepared in conventional CH4/SiH4 gas mixtures. Both types of films are compared with respect to their hydrogen content as well as infrared and effusion spectra.
Original language | English |
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Pages (from-to) | 1666-1668 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 54 |
Issue number | 17 |
DOIs | |
State | Published - 1989 |