Improved SAT-based ATPG: More constraints, better compaction

Stephan Eggersglus, Robert Wille, Rolf Drechsler

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

51 Scopus citations

Abstract

Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust alternative to classical structural ATPG. Due to the powerful reasoning engines of modern SAT solvers, SAT-based algorithms typically provide a high test coverage because of the ability to reliably classify hard-to-detect faults. However, a drawback of SAT-based ATPG is the test compaction ability. In this paper, we propose an enhanced dynamic test compaction approach which leverages the high implicative power of modern SAT solvers. Fault detection constraints are encoded into the SAT instance and a formal optimization procedure is applied to increase the detection ability of the generated tests. Experiments show that the proposed approach is able to achieve high compaction - for certain benchmarks even smaller test sets than the currently best known results are obtained.

Original languageEnglish
Title of host publication2013 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013 - Digest of Technical Papers
Pages85-90
Number of pages6
DOIs
StatePublished - 2013
Externally publishedYes
Event2013 32nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013 - San Jose, CA, United States
Duration: 18 Nov 201321 Nov 2013

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference2013 32nd IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2013
Country/TerritoryUnited States
CitySan Jose, CA
Period18/11/1321/11/13

Fingerprint

Dive into the research topics of 'Improved SAT-based ATPG: More constraints, better compaction'. Together they form a unique fingerprint.

Cite this