Impact of the self-heating effect on circuit performance estimation using DC model parameters

D. Takacs; J. Trager; D. Schmitt-Landsiedel

doi:10.1109/ICMTS.1988.672928

Impact of the self-heating effect on circuit performance estimation using DC model parameters

D. Takacs
, J. Trager
, D. Schmitt-Landsiedel

Siemens AG

Research output: Contribution to conference › Paper › peer-review

Abstract

Steady-state and transient self-heating effects as well as the electro-thermal coupling in VLSI MOST were investigated experimentally and theoretically.Local and time dependent temperature peaks were observed.The MOS devices operate in nonisothermal conditions.This leads to drifting operating conditions as well as to mismatch and coupling effects in IC operation.

Original language	English
Pages	50-55
Number of pages	6
DOIs	https://doi.org/10.1109/ICMTS.1988.672928
State	Published - 1 Feb 1988
Externally published	Yes
Event	1988 IEEE International Conference on Microelectronic Test Structures, ICMTS 1988 - Long Beach, United States Duration: 22 Feb 1988 → 23 Feb 1988

Conference

Conference	1988 IEEE International Conference on Microelectronic Test Structures, ICMTS 1988
Country/Territory	United States
City	Long Beach
Period	22/02/88 → 23/02/88

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10.1109/ICMTS.1988.672928

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@conference{51c13129d1774ac780dde0f36723f921,

title = "Impact of the self-heating effect on circuit performance estimation using DC model parameters",

abstract = "Steady-state and transient self-heating effects as well as the electro-thermal coupling in VLSI MOST were investigated experimentally and theoretically.Local and time dependent temperature peaks were observed.The MOS devices operate in nonisothermal conditions.This leads to drifting operating conditions as well as to mismatch and coupling effects in IC operation.",

author = "D. Takacs and J. Trager and D. Schmitt-Landsiedel",

note = "Publisher Copyright: {\textcopyright} 1988 IEEE.; 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS 1988 ; Conference date: 22-02-1988 Through 23-02-1988",

year = "1988",

month = feb,

day = "1",

doi = "10.1109/ICMTS.1988.672928",

language = "English",

pages = "50--55",

}

TY - CONF

T1 - Impact of the self-heating effect on circuit performance estimation using DC model parameters

AU - Takacs, D.

AU - Trager, J.

AU - Schmitt-Landsiedel, D.

PY - 1988/2/1

Y1 - 1988/2/1

N2 - Steady-state and transient self-heating effects as well as the electro-thermal coupling in VLSI MOST were investigated experimentally and theoretically.Local and time dependent temperature peaks were observed.The MOS devices operate in nonisothermal conditions.This leads to drifting operating conditions as well as to mismatch and coupling effects in IC operation.

AB - Steady-state and transient self-heating effects as well as the electro-thermal coupling in VLSI MOST were investigated experimentally and theoretically.Local and time dependent temperature peaks were observed.The MOS devices operate in nonisothermal conditions.This leads to drifting operating conditions as well as to mismatch and coupling effects in IC operation.

UR - https://www.scopus.com/pages/publications/85069214650

U2 - 10.1109/ICMTS.1988.672928

DO - 10.1109/ICMTS.1988.672928

M3 - Paper

AN - SCOPUS:85069214650

SP - 50

EP - 55

T2 - 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS 1988

Y2 - 22 February 1988 through 23 February 1988

ER -

Impact of the self-heating effect on circuit performance estimation using DC model parameters

Abstract

Conference

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