Impact of NBTI Aging on Self-Heating in Nanowire FET

Om Prakash, Hussam Amrouch, Sanjeev Manhas, Jorg Henkel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

10 Scopus citations

Abstract

This is the first work that investigates the impact of Negative Bias Temperature Instability (NBTI) on the Self-Heating (SH) phenomenon in Silicon Nanowire Field-Effect Transistors (SiNW-FETs). We investigate the individual as well as joint impact of NBTI and SH on pSiNW-FETs and demonstrate that NBTI-induced traps mitigate SH effects due to reduced current densities. Our Technology CAD (TCAD)-based SiNW-FET device is calibrated against experimental data. It accounts for thermodynamic and hydrodynamic effects in 3-D nano structures for accurate modeling of carrier transport mechanisms. Our analysis focuses on how lattice temperature, thermal resistance and thermal capacitance of pSiNW-FETs are affected due to NBTI, demonstrating that accurate self-heating modeling necessitates considering the effects that NBTI aging has over time. Hence, NBTI and SH effects need to be jointly and not individually modeled. Our evaluation shows that an individual modeling of NBTI and SH effects leads to a noticeable overestimation of the overall induced delay increase in circuits due to the impact of NBTI traps on SH mitigation. Hence, it is necessary to model NBTI and SH effects jointly in order to estimate efficient (i.e. small, yet sufficient) timing guardbands that protect circuits against timing violations, which will occur at runtime due to delay increases induced by aging and self-heating.

Original languageEnglish
Title of host publicationProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
EditorsGiorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1514-1519
Number of pages6
ISBN (Electronic)9783981926347
DOIs
StatePublished - Mar 2020
Externally publishedYes
Event2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, France
Duration: 9 Mar 202013 Mar 2020

Publication series

NameProceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020

Conference

Conference2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
Country/TerritoryFrance
CityGrenoble
Period9/03/2013/03/20

Keywords

  • interface traps
  • nanowire
  • NBTI
  • Self-heating

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