Impact of gate leakage on efficiency of circuit block switch-off schemes
- Stephan Henzler
- , Philip Teichmann
- , Markus Koban
- , Jörg Berthold
- , Georg Georgakos
- , Doris Schmitt-Landsiedel
- Technical University of Munich
- Infineon Technologies AG
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
1
Scopus
citations