Impact of gate leakage on efficiency of circuit block switch-off schemes

Stephan Henzler; Philip Teichmann; Markus Koban; Jörg Berthold; Georg Georgakos; Doris Schmitt-Landsiedel

doi:10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes

Stephan Henzler, Philip Teichmann, Markus Koban, Jörg Berthold, Georg Georgakos, Doris Schmitt-Landsiedel

Medicine and Health

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

1 Scopus citations

Abstract

Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.

Original language	English
Title of host publication	VLSI-SOC
Subtitle of host publication	From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003)
Editors	Manfred Glesner Leandro, Indrusiak, Hans Eveking, Ricardo Reis, Vincent Mooney
Pages	229-245
Number of pages	17
DOIs	https://doi.org/10.1007/0-387-33403-3_15
State	Published - 2006

Publication series

Name	IFIP International Federation for Information Processing
Volume	200
ISSN (Print)	1571-5736

Keywords

Circuit Block Switch-Off
GSCMOS
Gate-Tunneling
MTCMOS
Sleep-Transistor Scheme
ZZSCCMOS
ZigZag

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10.1007/0-387-33403-3_15

Cite this

Henzler, S., Teichmann, P., Koban, M., Berthold, J., Georgakos, G., & Schmitt-Landsiedel, D. (2006). Impact of gate leakage on efficiency of circuit block switch-off schemes. In M. G. Leandro, Indrusiak, H. Eveking, R. Reis, & V. Mooney (Eds.), VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003) (pp. 229-245). (IFIP International Federation for Information Processing; Vol. 200). https://doi.org/10.1007/0-387-33403-3_15

Henzler, Stephan ; Teichmann, Philip ; Koban, Markus et al. / Impact of gate leakage on efficiency of circuit block switch-off schemes. VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). editor / Manfred Glesner Leandro ; Indrusiak ; Hans Eveking ; Ricardo Reis ; Vincent Mooney. 2006. pp. 229-245 (IFIP International Federation for Information Processing).

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title = "Impact of gate leakage on efficiency of circuit block switch-off schemes",

abstract = "Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.",

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author = "Stephan Henzler and Philip Teichmann and Markus Koban and J{\"o}rg Berthold and Georg Georgakos and Doris Schmitt-Landsiedel",

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Henzler, S, Teichmann, P, Koban, M, Berthold, J, Georgakos, G & Schmitt-Landsiedel, D 2006, Impact of gate leakage on efficiency of circuit block switch-off schemes. in MG Leandro, Indrusiak, H Eveking, R Reis & V Mooney (eds), VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). IFIP International Federation for Information Processing, vol. 200, pp. 229-245. https://doi.org/10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes. / Henzler, Stephan; Teichmann, Philip; Koban, Markus et al.
VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). ed. / Manfred Glesner Leandro; Indrusiak; Hans Eveking; Ricardo Reis; Vincent Mooney. 2006. p. 229-245 (IFIP International Federation for Information Processing; Vol. 200).

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

TY - CHAP

T1 - Impact of gate leakage on efficiency of circuit block switch-off schemes

AU - Henzler, Stephan

AU - Teichmann, Philip

AU - Koban, Markus

AU - Berthold, Jörg

AU - Georgakos, Georg

AU - Schmitt-Landsiedel, Doris

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AB - Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.

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ER -

Henzler S, Teichmann P, Koban M, Berthold J, Georgakos G, Schmitt-Landsiedel D. Impact of gate leakage on efficiency of circuit block switch-off schemes. In Leandro MG, Indrusiak, Eveking H, Reis R, Mooney V, editors, VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). 2006. p. 229-245. (IFIP International Federation for Information Processing). doi: 10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes

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