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Impact ionization FETs based on silicon nanowires

  • M. T. Björk
  • , O. Hayden
  • , J. Knoch
  • , H. Riel
  • , H. Schmid
  • , W. Riess
  • IBM Zurich Research Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations
Original languageEnglish
Title of host publication65th DRC Device Research Conference
Pages171-172
Number of pages2
DOIs
StatePublished - 2007
Externally publishedYes
Event65th DRC Device Research Conference - South Bend, India
Duration: 18 Jun 200720 Jun 2007

Publication series

Name65th DRC Device Research Conference

Conference

Conference65th DRC Device Research Conference
Country/TerritoryIndia
CitySouth Bend
Period18/06/0720/06/07

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