ICMAT 2011 - Reliability and variability of semiconductor devices and ICs

Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou

Research output: Contribution to journal › Editorial

Original language	English
Pages (from-to)	1531
Number of pages	1
Journal	Microelectronics Reliability
Volume	52
Issue number	8
DOIs	https://doi.org/10.1016/j.microrel.2012.05.003
State	Published - Aug 2012

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title = "ICMAT 2011 - Reliability and variability of semiconductor devices and ICs",

author = "Asen Asenov and Ulf Schlichtmann and Tan, {Cher Ming} and Hei Wong and Xing Zhou",

year = "2012",

month = aug,

doi = "10.1016/j.microrel.2012.05.003",

language = "English",

volume = "52",

pages = "1531",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd.",

number = "8",

}

TY - JOUR

T1 - ICMAT 2011 - Reliability and variability of semiconductor devices and ICs

AU - Asenov, Asen

AU - Schlichtmann, Ulf

AU - Tan, Cher Ming

AU - Wong, Hei

AU - Zhou, Xing

PY - 2012/8

Y1 - 2012/8

UR - http://www.scopus.com/inward/record.url?scp=84863724160&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2012.05.003

DO - 10.1016/j.microrel.2012.05.003

M3 - Editorial

AN - SCOPUS:84863724160

SN - 0026-2714

VL - 52

SP - 1531

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 8

ER -