Hydrosilylation of Silicon Surfaces: Crystalline versus Amorphous

Andrea Lehner, Georg Steinhoff, Martin S. Brandt, Martin Eickhoff, Martin Stutzmann

Research output: Contribution to journalConference articlepeer-review

Abstract

Using thermally induced hydrosilylation, organic molecules were covalently bonded to H-terminated crystalline silicon (111) and hydrogenated amorphous silicon (a-Si:H) surfaces. The resulting chemical surface structure was analyzed by X-ray photoelectron spectroscopy (XPS) and compared to that of silicon surfaces covered by a native oxide or terminated with hydrogen. For both kinds of substrates, the presence of oxygen on the surface is found to hinder the hydrosilylation reaction. Stable H-termination as a starting point for a successful hydrosilylation can be obtained on a-Si:H surfaces with much less technological effort than on crystalline silicon surfaces. Photoconductivity measurements of the different a-Si:H surfaces at low intensity of illumination (monomolecular recombination regime) indicate that the hydrosilylated surface has less defects than the H-terminated surfaces or surfaces covered with native oxide. Spin-dependent photoconductivity measurements identify the dominant paramagnetic defect at the hydrosilylated a-Si:H surface to be the silicon dangling bond.

Original languageEnglish
Pages (from-to)473-478
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume762
DOIs
StatePublished - 2003
EventMaterials Research Proceedings: Amorphous and Nanocrystalline Silicon-Based Films - 2003 - San Francisco, CA, United States
Duration: 22 Apr 200325 Apr 2003

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