Hole emission from Ge/Si quantum dots studied by time-resolved capacitance spectroscopy

C. M.A. Kapteyn, M. Lion, R. Heitz, D. Bimberg, C. Miesner, T. Asperger, K. Brunner, G. Abstreiter

Research output: Contribution to journalArticlepeer-review

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Abstract

Emission of holes from self-organized Ge quantum dots (QDs) embedded in Si Schottky diodes is studied by time-resolved capacitance spectroscopy (DLTS). The DLTS signal is rather broad and depends strongly on the filling and detection bias conditions. The observed dependence is interpreted in terms of carrier emission from many-hole states of the QDs. The activation energies obtained from the DLTS measurements are a function of the amount of stored charge and the position of the Fermi level in the QDs.

Original languageEnglish
Pages (from-to)261-264
Number of pages4
JournalPhysica Status Solidi (B) Basic Research
Volume224
Issue number1
DOIs
StatePublished - Mar 2001

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