Abstract
We have studied the structural properties of highly periodic arrays of terrace steps in a Si/SiGe multilayer grown on a miscut Si(113) substrate by atomic force microscopy, x-ray reflection and high resolution x-ray diffraction. The data reveal a regular array of step bunches with vertical correlation within the multilayer and periodic surface steps extending over lengths of several tens of microns. The (113)-faceted terraces have a lateral period of about 360 nm which is locally modulated due to a long-range waviness of the surface.
Original language | English |
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Pages (from-to) | 1535-1537 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 73 |
Issue number | 11 |
DOIs | |
State | Published - 1998 |