Higher harmonics imaging in tapping-mode atomic-force microscopy

Robert W. Stark; Wolfgang M. Heckl

doi:10.1063/1.1626008

Higher harmonics imaging in tapping-mode atomic-force microscopy

Robert W. Stark, Wolfgang M. Heckl

University of Munich

Research output: Contribution to journal › Article › peer-review

130 Scopus citations

Abstract

The use of higher harmonic signals to determine the operating conditions of the tapping-mode atomic force microscopy (TMAFM) was discussed. Amplitude and phase of the cantilever motion were acquired in TMAFM. A shadow evaporation mask of a 4-nm-thick platinum carbon (Pt-C) layer on a fused silica coverslip was imaged in TMAFM to demonstrate the differentiation between distinct materials. Results show that the signal-to-noise ratio of the higher modes depends on the frequency of the harmonic.

Original language	English
Pages (from-to)	5111-5114
Number of pages	4
Journal	Review of Scientific Instruments
Volume	74
Issue number	12
DOIs	https://doi.org/10.1063/1.1626008
State	Published - Dec 2003
Externally published	Yes

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10.1063/1.1626008

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AB - The use of higher harmonic signals to determine the operating conditions of the tapping-mode atomic force microscopy (TMAFM) was discussed. Amplitude and phase of the cantilever motion were acquired in TMAFM. A shadow evaporation mask of a 4-nm-thick platinum carbon (Pt-C) layer on a fused silica coverslip was imaged in TMAFM to demonstrate the differentiation between distinct materials. Results show that the signal-to-noise ratio of the higher modes depends on the frequency of the harmonic.

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Higher harmonics imaging in tapping-mode atomic-force microscopy

Abstract

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