High voltage scheme optimization for secondary discharge mitigation in GEM-based detectors

L. Lautner, L. Fabbietti, P. Gasik, T. Klemenz

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We investigate the influence of the high voltage scheme elements on the stability of a detector based on a single 10×10 cm2 area GEM with respect to the secondary discharge occurrence. These violent events pose a major threat to the integrity of GEM detectors and their Front-End Electronics and need to be avoided by any means. For a single GEM setup, we propose a detailed high voltage scheme that is designed to prevent secondary discharges. We determine optimal values of the protection resistors and parasitic capacitances introduced by cables used in the system. The results of this paper may be used as a guideline for the optimization of more complicated multi-GEM detectors.

Original languageEnglish
Article numberP08024
JournalJournal of Instrumentation
Volume14
Issue number8
DOIs
StatePublished - 27 Aug 2019

Keywords

  • Electron multipliers (gas)
  • Gaseous detectors
  • Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)

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