High resolution imaging of twin intersections in Si/Ge superlattices on Ge(001) substrates

W. Wegscheider, K. Eberl, G. Abstreiter, H. Cerva, H. Oppolzer

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The formation of twin bands represents the only relaxation mechanism we observed in Si/Ge superlattices grown on Ge(001) substrates. High-resolution electron microscopy was applied to study the dislocation reactions which determine the defect structure of microtwin intersections. Based on these results a general dislocation model for multiple twinning in diamond structure semiconductors leading to polytypic transformations and particularily to the diamond hexagonal phase is proposed.

Original languageEnglish
Title of host publicationInstitute of Physics Conference Series
PublisherPubl by Inst of Physics Publ Ltd
Pages21-26
Number of pages6
Edition117
ISBN (Print)0854984062
StatePublished - 1991
EventProceedings of the Conference on Microscopy of Semiconducting Materials 1991 - Oxford, Engl
Duration: 25 Mar 199128 Mar 1991

Publication series

NameInstitute of Physics Conference Series
Number117
ISSN (Print)0373-0751

Conference

ConferenceProceedings of the Conference on Microscopy of Semiconducting Materials 1991
CityOxford, Engl
Period25/03/9128/03/91

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