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High-resolution differential phase contrast imaging using a magnifying projection geometry with a microfocus x-ray source

  • Martin Engelhardt
  • , Joachim Baumann
  • , Manfred Schuster
  • , Christian Kottler
  • , Franz Pfeiffer
  • , Oliver Bunk
  • , Christian David
  • Siemens AG
  • Technical University of Munich
  • Paul Scherrer Institut

Research output: Contribution to journalArticlepeer-review

136 Scopus citations

Abstract

Differential x-ray phase contrast imaging using a grating interferometer was combined with a magnifying cone beam geometry using a conventional microfocus x-ray tube. This brings the advantages of a magnifying cone beam setup, namely, a high spatial resolution in the micron range and the possibility of using an efficient, low resolution detector, into differential phase contrast imaging. The authors present methodical investigations which show how the primary measurement signal depends on the magnification factor. As an illustration of the potential of this quantitative imaging technique, a high-resolution x-ray phase contrast tomography of an insect is presented.

Original languageEnglish
Article number224101
JournalApplied Physics Letters
Volume90
Issue number22
DOIs
StatePublished - 2007
Externally publishedYes

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