High-frequency characterization of YBa2Cu3O 7-x thin films with coplanar resonators

G. Gieres, J. Kessler, J. Kraus, B. Roas, P. Russer, G. Soelkner, A. A. Valenzuela

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


Microwave measurements of the quality factor and the resonant frequency of coplanar lambda /2 resonators of YBa2Cu3O7-x on LaAlO3 have been made. The YBa2Cu3O 7-x thin films have been epitaxially grown by pulsed laser ablation and sputter deposition. Information about the dependence of the surface resistance on temperature, magnetic field and frequency has been obtained. The surface resistance was derived from the quality factors by comparison with a numerical partial wave synthesis calculation. To study the electric field inside the resonator, measurements with an electro-optic probe have been made. Good agreement with the microwave measurements has been found.

Original languageEnglish
Article number020
Pages (from-to)629-632
Number of pages4
JournalSuperconductor Science and Technology
Issue number11
StatePublished - 1991


Dive into the research topics of 'High-frequency characterization of YBa2Cu3O 7-x thin films with coplanar resonators'. Together they form a unique fingerprint.

Cite this