High-Fidelity Predictive Simulation of High Power Devices and Modules at the Rim of the Safe-Operating Area and beyond

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the 'safe operating area (SOA)'. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined 'mission profile'. In particular in the field of high power electronics, predictive high-fidelity computer simulations of 'virtual desctruction' are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.

Original languageEnglish
Title of host publication2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages19-28
Number of pages10
ISBN (Electronic)9781728134192
DOIs
StatePublished - Sep 2019
Event31st IEEE International Conference on Microelectronics, MIEL 2019 - Nis, Serbia
Duration: 16 Sep 201918 Sep 2019

Publication series

Name2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings

Conference

Conference31st IEEE International Conference on Microelectronics, MIEL 2019
Country/TerritorySerbia
CityNis
Period16/09/1918/09/19

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