TY - GEN
T1 - High-Fidelity Predictive Simulation of High Power Devices and Modules at the Rim of the Safe-Operating Area and beyond
AU - Wachutka, G.
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/9
Y1 - 2019/9
N2 - The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the 'safe operating area (SOA)'. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined 'mission profile'. In particular in the field of high power electronics, predictive high-fidelity computer simulations of 'virtual desctruction' are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.
AB - The development of high-performance power devices is increasingly supported by predictive computer simulations on the basis of well-calibrated physical device models. Today's challenge is to make virtual experiments and tests on the computer, which are qualitatively reliable and quantitatively accurate even for device structures that have never been built before, and under operational conditions that very rarely occur as long as the device is kept within the 'safe operating area (SOA)'. What we are interested in is to explore the rim of the SOA and even to go beyond it in order to study failure and, eventually, destruction mechanisms with a view to improving robustness and reliability of the devices with respect to a customer-defined 'mission profile'. In particular in the field of high power electronics, predictive high-fidelity computer simulations of 'virtual desctruction' are of utmost importance. We will illustrate today's state of the art with reference to selected real-life examples.
UR - http://www.scopus.com/inward/record.url?scp=85075361585&partnerID=8YFLogxK
U2 - 10.1109/MIEL.2019.8889604
DO - 10.1109/MIEL.2019.8889604
M3 - Conference contribution
AN - SCOPUS:85075361585
T3 - 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
SP - 19
EP - 28
BT - 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 31st IEEE International Conference on Microelectronics, MIEL 2019
Y2 - 16 September 2019 through 18 September 2019
ER -