High-Electron-Mobility AlGaN/GaN Transistors (HEMTs) for Fluid Monitoring Applications

R. Neuberger, G. Müller, O. Ambacher, M. Stutzmann

Research output: Contribution to journalArticlepeer-review

138 Scopus citations

Abstract

High-electron-mobility transistors (HEMTs) based on AlGaN/GaN heterostructures were successfully tested as chemically sensing devices. Exposing the unprotected polar OaN surface in the gate area of a HEMT to liquids of different polarity, milliampere changes in the source-drain current could be detected. These sensing effects are likely to arise from chemical interactions with a sheet of ionic charge on the free GaN surface which compensates the electronic charge of a two-dimensional electron gas at a subsurface AlGaN/GaN interface.

Original languageEnglish
Pages (from-to)85-89
Number of pages5
JournalPhysica Status Solidi (A) Applied Research
Volume185
Issue number1
DOIs
StatePublished - May 2001

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