Harmonic Voltage Reflection Analysis of UHF RFID Chips

Florian Muralter; Michael Hani; Hugo Landaluce; Asier Perallos; Erwin M. Biebl

doi:10.1109/TIM.2020.3043942

Harmonic Voltage Reflection Analysis of UHF RFID Chips

Florian Muralter, Michael Hani, Hugo Landaluce, Asier Perallos, Erwin M. Biebl

Associate Professorship of Very High Frequency Technology

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

In recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.

Original language	English
Article number	9290140
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	70
DOIs	https://doi.org/10.1109/TIM.2020.3043942
State	Published - 2021

Keywords

Nonlinear analysis
power reflection
radio frequency identification (RFID)

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10.1109/TIM.2020.3043942

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@article{854c44d4593144cab8a916458e25398e,

title = "Harmonic Voltage Reflection Analysis of UHF RFID Chips",

abstract = "In recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.",

keywords = "Nonlinear analysis, power reflection, radio frequency identification (RFID)",

author = "Florian Muralter and Michael Hani and Hugo Landaluce and Asier Perallos and Biebl, {Erwin M.}",

note = "Publisher Copyright: {\textcopyright} 1963-2012 IEEE.",

year = "2021",

doi = "10.1109/TIM.2020.3043942",

language = "English",

volume = "70",

journal = "IEEE Transactions on Instrumentation and Measurement",

issn = "0018-9456",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - JOUR

T1 - Harmonic Voltage Reflection Analysis of UHF RFID Chips

AU - Muralter, Florian

AU - Hani, Michael

AU - Landaluce, Hugo

AU - Perallos, Asier

AU - Biebl, Erwin M.

PY - 2021

Y1 - 2021

N2 - In recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.

AB - In recent years, the exploitation of the nonlinear behavior of ultrahigh-frequency (UHF) radio frequency identification (RFID) chips has gained popularity. This article presents a measurement platform for the harmonic characterization of UHF RFID chips. The measurement of the incident and reflected wave at the RFID chip terminals is performed using a digital sampling oscilloscope (DSO). A novel signal-processing methodology is presented to extract time-domain reflection coefficient equivalents from a DSO measurement at the different load modulation states. Using a simultaneous measurement of the reflection coefficient with a vector network analyzer, the obtained measurement results were validated. Furthermore, a comparison to using real-time sampling and a power spectral density analysis is presented.

KW - Nonlinear analysis

KW - power reflection

KW - radio frequency identification (RFID)

UR - http://www.scopus.com/inward/record.url?scp=85097936123&partnerID=8YFLogxK

U2 - 10.1109/TIM.2020.3043942

DO - 10.1109/TIM.2020.3043942

M3 - Article

AN - SCOPUS:85097936123

SN - 0018-9456

VL - 70

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

M1 - 9290140

ER -

Harmonic Voltage Reflection Analysis of UHF RFID Chips

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Keywords

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