Abstract
X-ray microscopy is an invaluable tool for the characterization of life and materials science samples on the submicron length scale. Particularly in case of hard X-rays, it combines high penetration power with elemental, chemical, and magnetic specificity. However, contrast decreases drastically at higher photon energies, and imaging modalities beyond mere absorption measurements become increasingly attractive. We discuss the use of a fully pixelated detector for hard X-ray scanning microscopy of a biological specimen in absorption, phase contrast, and dark-field imaging mode.
| Original language | English |
|---|---|
| Article number | 012054 |
| Journal | Journal of Physics: Conference Series |
| Volume | 186 |
| DOIs | |
| State | Published - 2009 |
| Externally published | Yes |
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